发明名称 Process for preventing deposition on inner surfaces of CVD reactor
摘要 A process for forming a thin film by chemical vapor deposition which comprises repeating a substrate processing step on one or more substrates placed inside a reaction chamber by introducing a reaction gas inside the reaction chamber. The process includes a step of introducing a passivation gas or the like for passivating the surface of a thin film deposited on the fixing jig or other peripheral members between substrate processing steps. The passivation gas is, for example, an adsorbent gas or an oxidizing gas. More specifically, an example of an adsorbent gas is a mixture of an inert gas and from 0.1 to 10% of NH3 gas or SiH2Cl2 gas, and an example of an oxidizing gas is a mixture of an inert gas and at least one selected from the group of oxygen, nitrogen, monoxide, and nitrogen dioxide. The inert gas may also be replaced with N2 gas.
申请公布号 US5728629(A) 申请公布日期 1998.03.17
申请号 US19940311681 申请日期 1994.09.23
申请人 ANELVA CORPORATION 发明人 MIZUNO, SHIGERU;YOSHIMURA, TAKANORI;KATSUMATA, YOSHIHIRO;TAKAHASHI, NOBUYOKI
分类号 C23C16/44;C23C16/54;H01L21/205;(IPC1-7):H01L21/285 主分类号 C23C16/44
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