发明名称 |
X-ray evaluation method with electron diffraction photos for orientation determination |
摘要 |
The method involves evaluating X-ray and electron diffraction photos, for orientation and precision determination of alloy composition. This enables determining the grating distortions and spatial state of stress. A computer technology method is used for comparing a diffraction photograph of a section from the reflection system is compare with one or a series of computer simulations, using a position-shape identification program. For the orientation determination, the position and shape identification program is used to turn and move the digitalised diffraction photograph until a maximum correspondence to the computer simulations of the diffraction reflections, or stereogram, is attained.
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申请公布号 |
DE19636612(A1) |
申请公布日期 |
1998.03.12 |
申请号 |
DE19961036612 |
申请日期 |
1996.09.10 |
申请人 |
WUENSCHE, DIETMAR, DR.-ING., 01109 DRESDEN, DE |
发明人 |
WUENSCHE, DIETMAR, DR.-ING., 01109 DRESDEN, DE |
分类号 |
G01N23/04;G01N23/20;(IPC1-7):G01N23/20;G01N23/207 |
主分类号 |
G01N23/04 |
代理机构 |
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