发明名称 X-ray evaluation method with electron diffraction photos for orientation determination
摘要 The method involves evaluating X-ray and electron diffraction photos, for orientation and precision determination of alloy composition. This enables determining the grating distortions and spatial state of stress. A computer technology method is used for comparing a diffraction photograph of a section from the reflection system is compare with one or a series of computer simulations, using a position-shape identification program. For the orientation determination, the position and shape identification program is used to turn and move the digitalised diffraction photograph until a maximum correspondence to the computer simulations of the diffraction reflections, or stereogram, is attained.
申请公布号 DE19636612(A1) 申请公布日期 1998.03.12
申请号 DE19961036612 申请日期 1996.09.10
申请人 WUENSCHE, DIETMAR, DR.-ING., 01109 DRESDEN, DE 发明人 WUENSCHE, DIETMAR, DR.-ING., 01109 DRESDEN, DE
分类号 G01N23/04;G01N23/20;(IPC1-7):G01N23/20;G01N23/207 主分类号 G01N23/04
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