摘要 |
A contact sensor for mapping the surface of a workpiece comprises a probe element 64, 70 moveable in relation to electrical contacts 52, 54, 56, 58, 60, 62 within the sensor, a biasing means 80 and first 52, 54, 56, 58, 60, 62 and second 66, 68 electrical contact means. The biasing means 80 biases the probe element to a rest position. The first electrical contact means 52, 54, 56, 58, 60, 62 are mounted on an element 50 of a rigid insulating material. The second electrical contact means 66, 68 are mounted in association with the probe element 64, 70 for movement therewith. When the probe element is in the rest position, the first and second electrical contact means make electrical contact and when the probe element is moved from the rest position the electrical contact is altered.
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申请人 |
IRWIN-HOUSTON, DONALD, CROMHALL, GLOUCESTERSHIRE, GB |
发明人 |
IRWIN-HOUSTON, DONALD, CROMHALL, GLOUCESTERSHIRE, GB |