| 摘要 |
<p>PROBLEM TO BE SOLVED: To enable accurate quantitative analysis independent of the fluctuation factor of absorbance caused by sample temperature by correcting a measured absorbance to a reference absorbance for preparing an analytical curve by a dislocation amount of the absorbance of a sample in response to an external fluctuation characteristic value and applying it on an analytical curve. SOLUTION: When a reference plate is set and a near infrared ray is emitted from the light source 3 of a near infrared ray spectroscope 1, the ray is subjected to spectroscopy by a diffraction grating 6 through a reflecting mirror 4, and reflecting light reflected on the reference plate is detected with a reflecting light detector 9. An average is derived by performing the measurement of a contrast spectrum corresponding to wavelength. Next, reflecting light from the reference specimen of known concentration is detected with the reflecting light detector 9, and absorbance is calculated from the contrast spectrum and a measuring spectrum. Next, an analytical curve is derived from the absorbance of a plurality of the reference specimens, temperature is changed to calculate a dislocation amount between the measured absorbance and the reference absorbance and the dislocation amount is stored to a memory. When the absorbance of an unknown specimen is measured, correction to the absorbance at reference temperature according to the stored dislocation amount is made and analysis is performed.</p> |
