发明名称 DUAL-GATE SINGLE-ELECTRON TRANSISTOR HAVING SELF-ALIGNMENT AND FABRICATING METHOD OF THE SAME
摘要 A self-aligned single-electron transistor and a fabricating method thereof are provided to prevent generation of parasitic components of parallel MOSFETs by forming dual gates at both sides centering around a control gate without overlapping therewith. Source and drain regions(22a,24a) are formed on a semiconductor substrate to be separated from each other. A channel region is between the source and drain regions. A control gate(40b) is formed on the channel region. A gate dielectric(70) is formed on an upper portion of the channel region by surrounding the control gate. Two sidewall gates(80a,80b) are formed and self-aligned at both sides of an upper portion of the gate dielectric centering around the control gate. The source and drain regions are self-aligned at each sidewall gate. A dielectric sidewall spacer is formed along each sidewall gate on the source and drain regions.
申请公布号 KR100800507(B1) 申请公布日期 2008.02.04
申请号 KR20060135357 申请日期 2006.12.27
申请人 SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION 发明人 PARK, BYUNG GOOK;KANG, SANG WOO
分类号 H01L29/775;H01L21/336 主分类号 H01L29/775
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