发明名称 |
DUAL-GATE SINGLE-ELECTRON TRANSISTOR HAVING SELF-ALIGNMENT AND FABRICATING METHOD OF THE SAME |
摘要 |
A self-aligned single-electron transistor and a fabricating method thereof are provided to prevent generation of parasitic components of parallel MOSFETs by forming dual gates at both sides centering around a control gate without overlapping therewith. Source and drain regions(22a,24a) are formed on a semiconductor substrate to be separated from each other. A channel region is between the source and drain regions. A control gate(40b) is formed on the channel region. A gate dielectric(70) is formed on an upper portion of the channel region by surrounding the control gate. Two sidewall gates(80a,80b) are formed and self-aligned at both sides of an upper portion of the gate dielectric centering around the control gate. The source and drain regions are self-aligned at each sidewall gate. A dielectric sidewall spacer is formed along each sidewall gate on the source and drain regions.
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申请公布号 |
KR100800507(B1) |
申请公布日期 |
2008.02.04 |
申请号 |
KR20060135357 |
申请日期 |
2006.12.27 |
申请人 |
SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION |
发明人 |
PARK, BYUNG GOOK;KANG, SANG WOO |
分类号 |
H01L29/775;H01L21/336 |
主分类号 |
H01L29/775 |
代理机构 |
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主权项 |
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地址 |
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