发明名称 |
SUBSCRIBER LINE TEST METHOD AND SUBSCRIBER CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To allow the subscriber circuit to economically test whether or not a subscriber line is brought into an AC induction state by eliminating an exclusive test equipment. SOLUTION: In the case of conducting the AC induction test, a DC bias current IDC is supplied via an ON/OFF switch SW and a resistor RDC, resulting that a common mode current detection output VCOM (=|VRA-VRB|) from a common mode current detection circuit 2 is obtained as a voltage proportional to an absolute value of an AC induction current and it is compared with a discrimination threshold voltage VTH by a discrimination circuit 3. When the comparison result indicates a relay of VCOM>VTH, it is discriminated that the subscriber line is in an AC induction state (abnormal state).
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申请公布号 |
JPH1070609(A) |
申请公布日期 |
1998.03.10 |
申请号 |
JP19960223861 |
申请日期 |
1996.08.26 |
申请人 |
HITACHI LTD;NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
SAKAI MASAYUKI;KITANO JUNJIRO;KASHIWABARA TAKAHIKO |
分类号 |
H04M3/30;(IPC1-7):H04M3/30 |
主分类号 |
H04M3/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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