发明名称 OPTICAL SCANNING TYPE TWO-DIMENSIONAL CONCENTRATION DISTRIBUTION MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To enhance the resolution of image by using a high resistant silicon base having a high specific resistance as semiconductor substrate. SOLUTION: A semiconductor substrate 1 is formed of, for example, P-type silicon substrate having a high resistance. When a sample 8 is put into a vessel 7, a potential according to pH of the sample 8 making contact with a sensing part 4 is generated on the surface of a Si3 N4 film 6. A bias voltage is applied between a counter electrode 10 and an ohmic electrode 11 to form a depletion layer 3, and a probe light 14 is emitted to the semiconductor substrate 1 which scanning in X, Y directions. A photoelectric current is generated, and this current quantity corresponds to pH of the sample 8 making contact with the sensing part 4. A two-dimensional image showing pH distribution is provided by the position signal (X, Y) and the current quantity. Since a P-type silicon substrate having a high resistance is used as the semiconductor substrate 1, the distance of the optical carrier reaching the depletion layer 3 is shortened because of the thick depletion layer 3 and the thin P layer 2, the width of lateral diffusion of the optical carrier is reduced, and the spatial resolution is improved.
申请公布号 JPH1062385(A) 申请公布日期 1998.03.06
申请号 JP19970095066 申请日期 1997.03.29
申请人 CHIKYU KANKYO SANGYO GIJUTSU KENKYU KIKO;HORIBA LTD 发明人 TOMITA KATSUHIKO;NAKANISHI TAKESHI;NAKAO MOTOI
分类号 G01N27/416;G01N27/00 主分类号 G01N27/416
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