发明名称 Improved integrated circuit structures and methods to facilitate accurate measurement of the ic devices
摘要 The present invention relates, in one embodiment, to an integrated circuit including a first circuit structure, a first conductive bonding pad coupled to the first circuit structure, a second circuit structure, and a second conductive bonding pad coupled to the second circuit structure. The first conductive bonding pad is arranged to be separated from the second bonding pad by a gap having a gap dimension. The gap dimension is configured to be bridged by a wire bond, thereby permitting the wire bond to electrically couple the first conductive bonding pad with the second conductive bonding pad when the wire bond is coupled to the first bonding pad and the second bonding pad at the gap.
申请公布号 AU4084697(A) 申请公布日期 1998.03.06
申请号 AU19970040846 申请日期 1997.08.21
申请人 CALIFORNIA MICRO DEVICES CORPORATION 发明人 JEFFREY C KALB
分类号 H01L27/04;H01L21/82;H01L21/822;H01L23/485 主分类号 H01L27/04
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