发明名称 NEGATIVE TYPE PHOTORESIST COMPOSITION
摘要 PROBLEM TO BE SOLVED: To obtain a negative type photoresist capable of forming a fine pattern. SOLUTION: This photoresist compsn. contains novolak type epoxy resin having a wt. average mol.wt. of 1,500-10,000 (expressed in terms of standard polystyrene) and represented by formula I and a photopolymn. initiator represented by formula II and initiating cationic polymn. under irradiation with UV. The amt. of the initiator is 5-30 pts.wt. per 100 pts.wt. of the epoxy resin. In the formula I, R is H or methyl, (1) is an integer of 0-3 and each of (m) and (n) is an integer of >=0 satisfying the wt. average mol.wt. of the epoxy resin. In the formula II, each of R1 and R2 is H, 1-4C alkyl or alkoxy, R3 is H, morpholino or an arom. group, M is a metal or metalloid, X is halogen, (a) is an integer of 1-6, a=(b-c), (c) is an integer of 2-7 equivalent to the valence of M, (b) is an integer of <=8 and b>c.
申请公布号 JPH1062991(A) 申请公布日期 1998.03.06
申请号 JP19960241114 申请日期 1996.08.23
申请人 SHIN ETSU CHEM CO LTD 发明人 FUJII TOSHIHIKO;KATO HIDETO;KOBAYASHI YOSHITAKA;UEDA TAKASHI
分类号 G03F7/029;G03F7/038;H01L21/027;(IPC1-7):G03F7/038 主分类号 G03F7/029
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