发明名称 METHOD FOR MANUFACTURING SILICON MIRROR-FINISH WAFER AND WORKING DEVICE FOR SILICON WAFER
摘要 PROBLEM TO BE SOLVED: To improve productivity when two or more kinds of such additive processes as formation of gettering area are performed, formation of a dopant evaporation-prevention protective film and oxygen donor erasing thermal process by performing two or more processes among processes in the same device. SOLUTION: Each of processes such as oxygen donor erasing thermal process, formation of gettering area and formation of a dopant evaporation-prevention film is selectively performed based on the specifications of the silicon mirror- finish wafer which is to be manufactured. In such a case, two or more processes among the work processes are performed in the same device according to the specifications. For example, two or more process chambers 11-14, selected among a process chamber for forming the gettering area, a process chamber for forming the dopant evaporation prevention protective film, and a process chamber for oxygen donor erasing thermal process, are provided. In addition, a processing device is used wherein, with a transportation means 15 for transporting a silicon wafer into each of process chambers 11-14 provided, the process chambers 11-14 can be operated at the same time.
申请公布号 JPH1064918(A) 申请公布日期 1998.03.06
申请号 JP19960235871 申请日期 1996.08.19
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 TAKAMIZAWA SHOICHI;KOBAYASHI NORIHIRO
分类号 H01L21/302;H01L21/00;H01L21/02;H01L21/306;H01L21/31;H01L21/322;H01L21/324;H01L21/677;(IPC1-7):H01L21/322;H01L21/68 主分类号 H01L21/302
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