发明名称 Verfahren zum Planarisieren einer Substratoberfläche
摘要 In a process for smoothening a substrate surface with level differences caused by metallic structures, a metallic layer made of a titanium compound is first applied on the surface and the side faces of the metallic structures before O3-activated separation of SiO2 or SiOF from a silicium precursor stage on the substrate surface provided with the metallic structures.
申请公布号 DE19634841(A1) 申请公布日期 1998.03.05
申请号 DE19961034841 申请日期 1996.08.28
申请人 SIEMENS AG, 80333 MUENCHEN, DE;FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V., 80636 MUENCHEN, DE 发明人 GRASL, THOMAS, DIPL.-PHYS., 85354 FREISING, DE;SPINDLER, OSWALD, DIPL.-CHEM. DR., 85591 VATERSTETTEN, DE;GABRIC, ZRONIMIR, 85604 ZORNEDING, DE
分类号 H01L21/768;H01L21/316;(IPC1-7):H01L21/321;H01L21/203;H01L21/205 主分类号 H01L21/768
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