发明名称 CLEANING DEVICE OF PHOTOMASK AND CLEANING METHOD OF PHOTOMASK
摘要 PROBLEM TO BE SOLVED: To easily remove foreign matters which firmly deposit on a mask without using hazardous chemicals by arranging an ozone water cleaning part, ice scribe cleaning part, ultrasonic cleaning part and warm water drawing and drying part. SOLUTION: A photomask set on a loader 10 is successively sent to an ozone water tank of an ozone cleaning part 11 and dipped for about 5 to 10min to carry out ozone water cleaning. Then the photomask is sent to an ice scribe cleaning part 12 where the mask is subjected to ice scribe cleaning for about 1 to 5min. Then the mask is sent to an ultrasonic cleaning part 13 where the mask is cleaned by ultrasonic waves of MHz frequencies for 5 to 10min in pure water in a ultrasonic cleaning device. Then the mask is subjected to warm water drawing and drying in a warm water drawing and drying part 14. Namely, an org. matter on the mask surface is removed by ozone water cleaning, a foreign matter having strong adhesion force is removed by ice scribe cleaning, and a foreign matter in a submicron size is removed by ultrasonic cleaning with pure water. Thus, foreign matters can be removed only by cleaning with water, which improves safeness and economic advantages.
申请公布号 JPH1062965(A) 申请公布日期 1998.03.06
申请号 JP19960222344 申请日期 1996.08.23
申请人 NEC CORP 发明人 TANAKA YOSHIYUKI
分类号 B08B3/08;B08B3/12;B08B7/04;G03F1/82;H01L21/304 主分类号 B08B3/08
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