发明名称
摘要 An improved semiconductor device having no posioned via produced therein includes a semiconductor substrate having a first conductor pattern formed thereon, a first insulator film provided on the semiconductor substrate to cover the first conductor pattern, and a coat applied onto the first insulator film to flatten an uneven surface of the first insulator film. A nitride layer having a thickness of 10 ANGSTROM or more and including a binding of silicon and nitrogen is provided in a surface of the coat. A second insulator film is formed on the coat including the nitride layer. A via hole for exposing a portion of the surface of the first conductor pattern is formed to penetrate the first insulator film, the coat and the second insulator film. The device further includes a second conductor pattern having a portion thereof buried in the via hole and thereby connected to the first conductor pattern.
申请公布号 JP2721942(B2) 申请公布日期 1998.03.04
申请号 JP19910324607 申请日期 1991.12.09
申请人 MITSUBISHI DENKI KK 发明人 II YOSHIKO;MATSURA MASAZUMI
分类号 H01L21/28;H01L21/3105;H01L21/768;H01L23/522;(IPC1-7):H01L21/768 主分类号 H01L21/28
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