发明名称 Solid state image pickup device and manufacturing method therefor
摘要 A method for manufacturing a light receiving portion for a solid state image pickup device includes the steps of forming a well of a second impurity type on a substrate of a first impurity type, forming a channel stop within an upper surface of the well, forming a vertical CCD portion within the upper surface of the well, forming a gate insulating layer on the upper surface of the well, channel stop and the vertical CCD portion, forming a charge carrying gate electrode above the vertical CCD portion, forming a light receiving photo diode by ion-implanting impurities of the first impurity type, forming a first impurity layer on the light receiving photo diode by ion-implanting impurities of the second impurity type into a surface of the light receiving photo diode, removing a portion of the gate insulating layer above the light receiving photo diode, depositing an insulating layer containing impurities of the first impurity type on the gate insulating layer, the charge carrying gate electrode and the first impurity layer, and performing a heat treatment to form a second impurity layer by doping an upper surface of the first impurity layer with the impurities of the insulating layer.
申请公布号 US5723354(A) 申请公布日期 1998.03.03
申请号 US19950568336 申请日期 1995.12.06
申请人 LG SEMICON CO., LTD. 发明人 PARK, YONG;MOON, SHANG-HO
分类号 H01L27/148;H01L31/0352;H04N5/335;H04N5/367;H04N5/369;H04N5/372;(IPC1-7):H01L21/339 主分类号 H01L27/148
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