发明名称 METHOD FOR MANUFACTURING EPITAXIAL WAFER
摘要 <p>A method for manufacturing an epitaxial wafer is provided to prevent friction between a susceptor and a rear edge part due to the bending of a silicon wafer by controlling the temperature of a susceptor when loading the silicon wafer on a reactive container. An epitaxial layer is formed in a surface of a silicon wafer(21) arranged inside a reactive container(20) by circulating the source gas in the reactive container. The temperature of a susceptor(24) is controlled according to the resistivity of the silicon wafer when loading the silicon wafer on the reactive container.</p>
申请公布号 KR20090089797(A) 申请公布日期 2009.08.24
申请号 KR20090012899 申请日期 2009.02.17
申请人 SUMCO CORPORATION 发明人 WADA NAOYUKI
分类号 H01L21/20 主分类号 H01L21/20
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