Verfahren zum Messen einer Verzögerungszeit und Impulserzeugungseinrichtung zum Messen einer Verzögerungszeit für den Einsatz bei der Implementierung dieses Verfahrens

摘要

A method for accurately measuring the delay time of a signal path (10) constituted by an IC of a CMOS structure in a state which is the same as, or approximate to, the actual operation state. A loop oscillation circuit including the signal path (10) is constittuted, and is brought into a loop oscillation state by feeding a start pulse ST to the circuit. An interpolation pulse P 1 having a frequency which is the same as, or approximate to, the frequency of the pulse signal propagated with the signal path is in an actual operation state, is inserted, this interpolation pulse P 1 and the loop oscillation signal P LO are fed to the signal path, and the signal path is brought into the substantially same temperature state as that of the actual operation state. The cycle of the loop oscillation signal P LO is measured under this state so as to measure the delay time of the signal path.