发明名称 Fault repair method for memory component
摘要 The method involves using a redundant memory with spare lines and columns and starts by determining if a component can be repaired, based on interference frequency measurement. In positive case the faulty lines are repaired and in negative case the faulty bits are repaired. The faulty address information is extracted from spare column sections of a buffer memory, when a limit for, or on, a limbo section exists. Then follows a control check of a limbo section for obtained repair addresses in a block unit and adjustment of repair addresses. Then data, dealing with results of the adjusted repair are prepared.
申请公布号 DE19736250(A1) 申请公布日期 1998.02.26
申请号 DE19971036250 申请日期 1997.08.20
申请人 ADVANTEST CORP., TOKIO/TOKYO, JP 发明人 OGINO, JUNKO, TOKIO/TOKYO, JP
分类号 G06F12/16;G11C29/00;G11C29/44;(IPC1-7):G11C29/00 主分类号 G06F12/16
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