| 摘要 |
An antifuse detect circuit senses the conductance of a programmable element, such as an antifuse or fuse, and provides a logic output corresponding to the state of the programmable element. A capacitor precharges a comparator input above its input voltage trip point. The programmable element discharges the comparator input below the trip point depending upon its conductance state. The circuit allows quick and accurate sensing of the state of the programmable element, even when it is only marginally conductive, and improves reliability of the programmable element. The programmable element is used in remapping memory cells such as in a dynamic random access memory (DRAM). The state of the programmable element is sensed during precharging of addressing logic, and optionally latched when a row address strobe (RAS) signal is asserted. |
