发明名称 RF INSPECTION JIG
摘要 PROBLEM TO BE SOLVED: To provide an RF inspection jig capable of stably measuring high frequency characteristics of a product by maintaining the load to press an RF pad of the product with an RF probe at a specific level while preventing the RF pad of the product and the RF probe from getting damaged.SOLUTION: An RF probe 5 is suspended from a support member 3 via a spring 4. The RF probe 5 is arranged to be movable in a vertical direction to come into contact with an RF pad 7 of a product 1 to supply an RF signal to the product 1. The load to press the RF pad 7 of the product 1 with the RF probe 5 can be maintained at a constant level by means of the spring 4.SELECTED DRAWING: Figure 2
申请公布号 JP2016125983(A) 申请公布日期 2016.07.11
申请号 JP20150002394 申请日期 2015.01.08
申请人 MITSUBISHI ELECTRIC CORP 发明人 MIKAMI YOHEI;YAMAMOTO AKIRA;TANIGUCHI YUTAKA
分类号 G01R31/00;G01R1/067 主分类号 G01R31/00
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