发明名称 Method and apparatus for testing integrated magnetic head assembly
摘要 A method and apparatus for testing an integrated magnetic head assembly for normal operation. The head assembly includes an inductive write element and a MR read element. The method includes a step of applying an external alternating magnetic field to a plurality of magnetic head assemblies which are aligned on a head block and are not yet individually separated from the head block, in a direction perpendicular to an ABS of the head block, and also applying high frequency current to the inductive write element so that alternating leakage magnetic field from the inductive write element is applied to the MR read element, and a step of measuring varying resistance characteristics of the MR read element with respect to the variation of the external alternating magnetic field and to the variation of the alternating leakage magnetic field.
申请公布号 US5721488(A) 申请公布日期 1998.02.24
申请号 US19960656846 申请日期 1996.05.30
申请人 TDK CORPORATION 发明人 SAKAI, MASANORI;TOMITA, KATSUHIKO;IWAI, YUZURU
分类号 G11B5/39;G11B5/455;(IPC1-7):G01R33/12 主分类号 G11B5/39
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