发明名称 |
METHOD OF X-RAY FLUORESCENT ANALYSIS |
摘要 |
FIELD: analytical methods. SUBSTANCE: optically thin submicron film of selective ion-exchange material (or chelate) is formed on smooth surface of a substrate. Investigated solution is brought in contact with the film for a specified time and remains of solution are removed. The thus prepared film is subjected to primary monochromatized radiation within specified spectral range. Desired signal is registered by X-ray- fluorescent spectrometer and element composition is calculated. EFFECT: increased reliability of analysis. 4 cl, 1 dwge
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申请公布号 |
RU2105291(C1) |
申请公布日期 |
1998.02.20 |
申请号 |
RU19960117160 |
申请日期 |
1996.08.27 |
申请人 |
SKIJ NAUCHNO-ISSLEDOVATEL'SKIJ INSTITUT EHKSPERIME;ROSSIJSKIJ FEDERAL NYJ JADERNY;SKIJ NI SKIJ I EHKSPERIME |
发明人 |
DANILIN L.D.;MOROVOV A.P.;ZHMAJLO V.V.;DANILIN L.D.;MOROVOV A.P.;ZHMAJLO V.V. |
分类号 |
G01N23/223;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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地址 |
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