| 摘要 |
PROBLEM TO BE SOLVED: To make an automatic decision whether a test can be performed or not by comparing the total capacity of a pattern object being used at the time of LSI test with the memory capacity of a tester. SOLUTION: Circuit information 30 including pin position information, net list of circuit, power consumption information etc., a library 33 including a tester pin library, a clock macro, I/O macro, etc., test object macro information 31, and a model 32 of individual program are used as information. The information is inputted to a pin corresponding information generating means 11, a test object pin extracting means 12, an enhanced power supply, an enhanced ground information generating means 13, a test possibility decision means 19, and an individual test program generating means 20 thus generating an individual test program 50. The test possibility decision means 19 checks the memory capacity of the LSI tester based on the pattern object information of the circuit information 30 and steps to the individual test program generating means 20 when it is not exceeded thus generating the individual test program 50. |
