发明名称 APPARATUS FOR ANALYZING ION SCATTERING
摘要 <p>PROBLEM TO BE SOLVED: To separate atoms in a crystal structure to be distinguishable and display a crystal in a manner easy to recognize, by simulating and calculating a scattering intensity of ions on the basis of input measuring conditions for data of the crystal structure and an angular dependency. SOLUTION: An input device 2 inputs measuring conditions for data of a crystal structure of a sample to be simulated and an angular dependency of a signal intensity in coaxial impact collision ion scattering, and designated atoms in the crystal structure and display colors. A simulation calculation part 3 simulates and calculates a scattering intensity of ions based on the input measuring conditions for the crystal structure data and angular dependency, thereby obtaining the signal intensity for each angle. A display control part 4 sets a plurality of display areas on a screen of a display device 7 in accordance with a command from the input device 2, and displays angular dependency data from a data-processing part 6, a model formation data 6 from a model formation part 3a, operation results from an operation part 3b, etc., at respective display areas.</p>
申请公布号 JPH1048162(A) 申请公布日期 1998.02.20
申请号 JP19960203470 申请日期 1996.08.01
申请人 SHIMADZU CORP 发明人 SHINOHARA MAKOTO;NISHIHARA TAKAHARU;ISHIYAMA OSAMU
分类号 G01N23/225;G01N23/20;H01J37/252;H01J37/295;(IPC1-7):G01N23/225 主分类号 G01N23/225
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