| 摘要 |
PROBLEM TO BE SOLVED: To shorten a test time. SOLUTION: This register is provided with a control circuit 6 which makes duty of a clock pulse supplied to clocked inverters 2, 3 constituting a dynamic shift register section 1 at the time of a test smaller than duty at the time of normal operation. Therefore, a floating time of the clocked inverters 2, 3 is made longer without changing a frequency of a clock pulse at the time of test operation, malfunction is made easy to occur, and a test time in which a bad condition is supposed is shortened. |
