发明名称 ASSOCIATED MEMORY
摘要 PROBLEM TO BE SOLVED: To reduce largely the length of total wiring of a retrieving data line, to reduce the capacity of a bit line of a memory, and to increase reading/writing operation speed by dividing a memory cell array of one bit into plural columns. SOLUTION: The length of total wiring of a retrieving data line is largely reduced by dividing a memory cell array into four columns, in an associated memory consisting of (b)bits/4×n words. At the time of reading out, selected memory cell information is amplified and detected by reading/writing circuits 221-22b through pairs of bit line BL11-BLb4, column selecting circuit 211-21b, an outputted as read-out data D01-D0b. At the time of writing, input data Di1-Dib is written in a memory cell selected by reading/writing circuits 221/22b. As a data path used at the time of reading/writing operation is separated from a data path used at the time of comparison operation, these both operations never interfere each other.
申请公布号 JPH1050076(A) 申请公布日期 1998.02.20
申请号 JP19960220370 申请日期 1996.08.02
申请人 NEC CORP 发明人 SHINDO TAKESHI
分类号 G11C15/04;(IPC1-7):G11C15/04 主分类号 G11C15/04
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