发明名称 AN ANGULAR ALIGNMENT OF THE ION DETECTOR SURFACE IN TIME-OF-FLIGHT MASS SPECTROMETERS
摘要 <p>Electrostatic deflectors (11, 12) are used in a time-of-flight mass spectrometer to steer ions (41) into a detector (40) positioned at the end of a drift region (28); where the detector (40) is tilted in relation with the steered ion beam (41) in a manner which improves mass spectral resolution.</p>
申请公布号 WO1998007176(A1) 申请公布日期 1998.02.19
申请号 US1997013625 申请日期 1997.08.04
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