发明名称
摘要 PURPOSE:To calibrate a loop probe in a wide frequency band without requiring expensive devices by defining a magnetic field in a TEM mode generated by an unbalanced microstrip line as a reference magnetic field strength. CONSTITUTION:A high frequency signal generated by a high frequency signal generator 8 is fed to a microstrip line 3. The line 3 is in an unbalanced form, constructed by a strip conductor 4 and a grounding conductor 5. The conductor 4 has one end connected to a matching load 7 and the other connected to a current supply connector. A magnetic field generated is received by a loop probe 2 to be calibrated and the output voltage is measured by a high frequency voltage measuring instrument 9. An average field density Hav in a loop plane is found from the strength of a magnetic field generated in the line 3. The loop probe is calibrated by finding the ratio of the field strength Hav in the loop probe plane for field components perpendicular to the loop probe plane to the output voltage of the probe.
申请公布号 JP2715876(B2) 申请公布日期 1998.02.18
申请号 JP19930330431 申请日期 1993.12.27
申请人 发明人
分类号 G01R35/00;G01R29/00;G01R29/08;G01R29/10;G01R33/02;H01P1/00;H01P3/08 主分类号 G01R35/00
代理机构 代理人
主权项
地址