发明名称 DATA ANALYSIS SUPPORT SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To completely tie up data on a lot when a large number of divided events are caused over a large number of processes. SOLUTION: A data analysis support system 1 automatically gathers process data of a process control system and measuring data of a manufacturing device 23, and stores gathered data in a relational database, and outputs a document or a graph of the data unitarily controlled according to a demand from an operator. When the process data and the measuring data are stored in the relational database, an event such as division and derivation is considerd. For example, an event to divide a lot (a') from a lot (a) is caused in a beginning condition between processes A and B, since a master lot of a lot (a) is the lot (a) in both processes A and B, when a document or a graph is outputted, the process data and the measuring data of the lot (a) are referred as they are, on the one hand, in the case of the lot (a'), since a master lot is registered as the lot (a) in the process A, the process data and the measuring data attached to the lot (a) are referred.</p>
申请公布号 JPH1043997(A) 申请公布日期 1998.02.17
申请号 JP19960200156 申请日期 1996.07.30
申请人 SONY CORP 发明人 KAMIMURA HIROICHI;HIDAKA SHUICHI
分类号 B23Q41/08;G05B19/418;(IPC1-7):B23Q41/08 主分类号 B23Q41/08
代理机构 代理人
主权项
地址