发明名称 Metal alloy interconnections for integrated circuits
摘要 Novel metal-alloy interconnections for integrated circuits. The metal-alloy interconnections of the present invention comprise a substantial portion of either copper or silver alloyed with a small amount of an additive having a low residual resistivity and solid solubility in either silver or copper such that the resultant electrical resistivity is less than 3 mu OMEGA -cm.
申请公布号 US5719447(A) 申请公布日期 1998.02.17
申请号 US19950454005 申请日期 1995.05.30
申请人 INTEL CORPORATION 发明人 GARDNER, DONALD S.
分类号 H01L23/532;(IPC1-7):H01L23/48 主分类号 H01L23/532
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