发明名称 |
Semiconductor device including bipolar transistor with improved current concentration characteristics |
摘要 |
An N-type buried region formed in the surface area of a semiconductor substrate is electrically connected to an N-type collector region formed in an epitaxial silicon layer on the semiconductor substrate. A P-type buried region is formed to overlap part of the N-type buried region. The P-type buried region is thick in the upward and downward directions of the N-type buried region. One end portion of the P-type buried region is electrically connected to a P-type base region and the other end portion thereof is electrically connected to a base region formed in the surface area of the semiconductor layer. The base region is applied with a base potential from the base region via the buried region. An N-type emitter region is formed in the base region. The N-type buried region and the P-type buried region are simultaneously formed by use of a difference between the diffusion coefficients of impurity.
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申请公布号 |
US5719432(A) |
申请公布日期 |
1998.02.17 |
申请号 |
US19960670105 |
申请日期 |
1996.06.25 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KARIYAZONO, HIROSHI;HONNA, KATSU |
分类号 |
H01L21/331;H01L29/10;H01L29/73;H01L29/732;(IPC1-7):H01L29/732 |
主分类号 |
H01L21/331 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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