发明名称 Multiple implant lightly doped drain (MILDD) field effect transistor
摘要 A multiple implant lightly doped drain ("MILDD") field effect transistor is disclosed. The transistor includes a channel, a gate, a dielectric structure that separates the gate from the channel, a source region and a drain region. The drain region has a first drain subregion, a second drain subregion and a third drain subregion. Each drain subregion has a dopant concentration that differs from that of the other two drain subregions. A method of forming the same is also disclosed.
申请公布号 US5719425(A) 申请公布日期 1998.02.17
申请号 US19960594516 申请日期 1996.01.31
申请人 MICRON TECHNOLOGY, INC. 发明人 AKRAM, SALMAN;DITALI, AKRAM
分类号 H01L21/336;H01L29/10;H01L29/78;(IPC1-7):H01L29/76;H01L29/94 主分类号 H01L21/336
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