发明名称 SCANNING TYPE MASS SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To realize high accurate detection, even including an interference composition which is difficult to make correct detection to by providing a device for grating ions emitted from an measuring object according to the mass number and also concurrently detecting a grated region. SOLUTION: An element, ionized by inductively coupled plasma(ICP) generated in a torch, is focused via a sampling cone 10 and skimmer cone 12, to be sent to a pulsar 16 via an ion lens 14 composed of a quadruple lens. An ion beam, passed the pulsar 16 for a necessary time, is reflected by a mass reflector 18 according to the number of the mass, to detect reflected ions by an ion detector 20, to obtain the entire mass spectrum. To obtain a detailed mass spectrum, the given portion range of the mass spectrum reflected by the ion detector 20 is grated by mass grating 22 according to the mass number, and a grated range is detected by an array type detector 26.
申请公布号 JPH1040859(A) 申请公布日期 1998.02.13
申请号 JP19960197454 申请日期 1996.07.26
申请人 YOKOGAWA ANALYTICAL SYST KK 发明人 MORIOKA AKIHIRO
分类号 H01J49/06;H01J49/34;(IPC1-7):H01J49/34 主分类号 H01J49/06
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