发明名称 FLUORESCENT X-RAY SPECTROMETER
摘要 <p>PROBLEM TO BE SOLVED: To attain precise analysis by heating samples before detection, maintaining at a prescribed temperature or more a temperature of the samples during detection, and stabilizing fluorescent X-ray intensity. SOLUTION: A heating means 1 such as an infrared lamp, a nichrome wire is provided for a turret 21, a sample cap 11 is still on the turret 21 together with a cap body 19, and a sample 12 is heated before detection of a fluorescent X-ray B2 from the sample 12 due to a detector 34. Before detection the heating means 1 is controlled by controlling means 5, and a temperature of the sample 12 during detection is maintained to a prescribed temperature or more. Thus, the temperature of the sample 12 being detected is maintained to the prescribed temperature or more, and even in the sample 12 in which intensity is not stable until the prescribed temperature or more, the intensity of the fluorescent X-ray B2 generated is stabilized, making it possible to perform analysis precisely.</p>
申请公布号 JPH1038824(A) 申请公布日期 1998.02.13
申请号 JP19960209219 申请日期 1996.07.18
申请人 RIGAKU IND CO 发明人 SHIZUTOSHI KOHEI;INOUE MINORU;FURUSAWA EIICHI;KONO HISAMASA
分类号 G01N23/223;G01N1/28;(IPC1-7):G01N23/223 主分类号 G01N23/223
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