发明名称 SURFACE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a surface inspection device which can judge in a short time whether the surface of an object to be inspected is normal or abnormal. SOLUTION: A picture signal showing a one-dimensional picture of an object to be inspected is inputted repeatedly by a CCD line sensor 22, and the picture signal is preprocessed and corrected through shading, then it is converted into a digital signal. Further, the one-dimensional picture which is converted into a digital signal and shows a picture signal is converted into a binarized picture through a binarized picture conversion means 26, which is represented by two values, one and zero. Then, a clock signal having a specified clock cycle is generated by a clock signal generation means 28, and the clock pulse of the clock signal generated thereby is measured with a counter 27 as to obtain respective widths of the binarized picture obtained by the means 26 in which one and zero continue respectively. Further, the width obtained by the counter 27 is compared with a reference width by a judging means 29, thereby judging whether the surface of the object to be inspected in the one-dimensional picture is normal or abnormal.
申请公布号 JPH1038545(A) 申请公布日期 1998.02.13
申请号 JP19960194885 申请日期 1996.07.24
申请人 ONO SOKKI CO LTD 发明人 KAWAHARA HIROSHI
分类号 G01B11/30;G01N21/88;G01N21/93;G01N21/95;G06T1/00;G06T7/00 主分类号 G01B11/30
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