发明名称 SUBSTRATE TREATING METHOD
摘要 PROBLEM TO BE SOLVED: To reproduce the temperature of a substrate with high accuracy by heat-treating a dummy substrate in a heat treatment chamber and, after putting the wall surface forming material of the heat treatment chamber in the same heat cycle as that used for the heat treatment of the wafer at the heat treatment of the substrate. SOLUTION: Before a first wafer is heat-treated in a lamp anneal chamber 18, a dummy wafer taken out from a shelf chamber 24 is inserted into the chamber 18. Then the dummy wafer is heat-treated until the wall. surface forming material of the chamber 18 is put in the same heat cycle as that used for the heat treatment of the wafer by heating the dummy wafer by photoirradiation. When the wall surface forming material of the chamber 18 reproduces a normal heat cycle, the first wafer is inserted into the chamber 18 for heat treatment successively to the removal of the dummy wafer from the chamber 18. Thereafter, a plurality of wafers is heat-treated one by one according to the same recipe.
申请公布号 JPH1041239(A) 申请公布日期 1998.02.13
申请号 JP19960212984 申请日期 1996.07.22
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 NISHIHARA HIDEO;CHIBA TAKATOSHI;MASUDA MITSUHIRO;NAKAJIMA TOSHIHIRO
分类号 H01L21/677;H01L21/205;H01L21/26;H01L21/68;(IPC1-7):H01L21/26 主分类号 H01L21/677
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