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发明名称
Vergleichsschaltung für ein Halbleitertestsystem
摘要
申请公布号
DE19780110(T1)
申请公布日期
1998.02.12
申请号
DE19971080110T
申请日期
1997.01.20
申请人
ADVANTEST CORP., TOKIO/TOKYO, JP
发明人
YOSHIDA, KENJI, GYODA, SAITAMA, JP
分类号
G01R31/28;G01R19/165;G01R31/317;G01R31/319;G01R31/3193;H03K5/003;H03K5/24;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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