| 摘要 |
<p>A two-dimensional imaging backscatter probe (12) has a radiation source (20), a radiation detector (22), and a position sensing device (24) to which the radiation detector is attached. A mapping circuit generates a two-dimensional map of backscattered radiation as a function of position of the radiation detector. A display (44) displays the two-dimensional map. The two-dimensional imaging backscatter probe of the present invention facilitates non-destructive/non-intrusive inspection of a test article for contraband and/or structural integrity inspection.</p> |
