| 摘要 |
<p>To provide a time measuring apparatus which is compact and capable of highly accurate measurements, on a semiconductor chip, DFF circuits F10 through F1f constituting a delayed-signal holding circuit 11 of channel CH1 and DFF circuits F20 through F2f constituting a delayed-signal holding circuit 21 of channel CH2 are disposed alternatingly and in a single row in a circuit region of the delayed-signal holding circuits 11 and 12 to latch delayed signals DY0 through DYf from a pulse-circulating circuit 4, and DFF circuits F1j and F2j (where i = 0 through 9 and a through f) to latch the same delay signals DYj are mutually adjacent. Due to this, distances between the pulse-circulating circuit 4 and the respective delayed-signal holding circuits 11 and 12 become equal, and delay signals DY0 through DYf having no deviation in delay due to difference in wiring length are supplied to the respective channels, and so uniform measurement can be performed between the respective channels. <IMAGE></p> |
