发明名称 |
Dark rims for attenuated phase shift mask |
摘要 |
A mask for use in semiconductor fabrication which includes a light transparent substrate, preferably glass, having a border and light semitransparent material having light transmissivity preferably in the range of from about 6 to about 10 percent disposed thereon within the border. A light opaque layer which is sensitive to light and which can be patterned and have a predetermined portion thereof removed in response to selective exposure to light is disposed along substantially the entire border of the substrate. The mask can further include a region of light semitransparent material disposed around the border and under the light opaque layer. The light opaque layer is preferably a photosensitive polyimide.
|
申请公布号 |
US5716738(A) |
申请公布日期 |
1998.02.10 |
申请号 |
US19960660294 |
申请日期 |
1996.06.07 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
GARZA, CESAR M. |
分类号 |
G03F1/00;G03F1/14;(IPC1-7):G03F9/00 |
主分类号 |
G03F1/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|