发明名称 Dark rims for attenuated phase shift mask
摘要 A mask for use in semiconductor fabrication which includes a light transparent substrate, preferably glass, having a border and light semitransparent material having light transmissivity preferably in the range of from about 6 to about 10 percent disposed thereon within the border. A light opaque layer which is sensitive to light and which can be patterned and have a predetermined portion thereof removed in response to selective exposure to light is disposed along substantially the entire border of the substrate. The mask can further include a region of light semitransparent material disposed around the border and under the light opaque layer. The light opaque layer is preferably a photosensitive polyimide.
申请公布号 US5716738(A) 申请公布日期 1998.02.10
申请号 US19960660294 申请日期 1996.06.07
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 GARZA, CESAR M.
分类号 G03F1/00;G03F1/14;(IPC1-7):G03F9/00 主分类号 G03F1/00
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