发明名称 Cantilever and process for fabricating it
摘要 A probe formed in a flexible portion of a cantilever is protected by a protection frame. This protection frame is separated from a support portion at a border of a groove between the protection frame and the support portion. A piezoelectric crystal layer is formed in the flexible portion, and when the flexible portion is bent by an interatomic force acting between the probe and a sample, a voltage induced between the both ends of the piezoelectric crystal layer changes.
申请公布号 US5717132(A) 申请公布日期 1998.02.10
申请号 US19960637389 申请日期 1996.04.25
申请人 NIKON CORPORATION 发明人 WATANABE, SHUNJI;FUJIU, TAKAMITSU
分类号 G01B21/30;G01B5/28;G01N23/00;G01N37/00;G01Q20/04;G01Q60/34;G01Q60/38;G01Q70/08;G01Q70/14;H01J37/28;(IPC1-7):G01B5/28 主分类号 G01B21/30
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