发明名称 Focal plane phase-shifting lithography
摘要 A lithographic system for patterned exposure of radiation-sensitive resist comprises a radiation source, a mask, a converging optical element having a focal plane, and a phase-shifting optical element disposed at the focal plane of the converging optical element. The lithographic system produces enhanced images.
申请公布号 US5717218(A) 申请公布日期 1998.02.10
申请号 US19940365279 申请日期 1994.12.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COUFAL, HANS JUERGEN;GRYGIER, ROBERT KEITH
分类号 G03F7/20;(IPC1-7):G21K5/00 主分类号 G03F7/20
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