| 摘要 |
A method and apparatus for imaging an object with a planar sectioning microscope (109). The method locates a plane of best focus of the microscope at sequential planes within the object and images the object at each plane. A slice is removed from the object with a microtome (102), the slice including a section corresponding to at least one of the previously imaged planes. The plane of best focus is translated to a third plane within the object, and another plane is imaged. The apparatus includes a microtome (102) for cutting a slice from the object upon command of a control program, a planar sectioning microscope (109) having a plane of best focus and a narrow depth of focus for imaging the object, and an optical mount for adjustably translating the plane of best focus relative to the object (125). |
