发明名称 |
Lithographic mask production without need for SOI wafer |
摘要 |
A lithographic mask production process involves: (a) forming insulation film patterns (21) spaced apart by predetermined distances on a substrate (20); (b) forming doped regions (22) in the exposed substrate regions using the patterns (21) as masks; (c) forming a conductive layer (23) over the entire surface of the doped regions (22) and the patterns (21) and then patterning the conductive layer (23) to form first microscopic holes; (d) selectively removing material from the substrate back face until each doped region (22) is exposed; and (e) selectively etching the doped regions (22) to form second microscopic holes in the doped region sections corresponding to the first microscopic holes. Also claimed is a lithographic mask with a semiconductor substrate (20) having patterns, doped regions between the patterns, back face trenches exposing the doped regions, and holes passing through the doped regions. |
申请公布号 |
DE19708766(A1) |
申请公布日期 |
1998.02.05 |
申请号 |
DE1997108766 |
申请日期 |
1997.03.04 |
申请人 |
LG SEMICON CO., LTD., CHEONGJU, KR |
发明人 |
CHOI, YONG-KYOO, CHEONGJU, KR |
分类号 |
C25F3/14;G03F1/16;G03F1/20;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
C25F3/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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