发明名称 Lithographic mask production without need for SOI wafer
摘要 A lithographic mask production process involves: (a) forming insulation film patterns (21) spaced apart by predetermined distances on a substrate (20); (b) forming doped regions (22) in the exposed substrate regions using the patterns (21) as masks; (c) forming a conductive layer (23) over the entire surface of the doped regions (22) and the patterns (21) and then patterning the conductive layer (23) to form first microscopic holes; (d) selectively removing material from the substrate back face until each doped region (22) is exposed; and (e) selectively etching the doped regions (22) to form second microscopic holes in the doped region sections corresponding to the first microscopic holes. Also claimed is a lithographic mask with a semiconductor substrate (20) having patterns, doped regions between the patterns, back face trenches exposing the doped regions, and holes passing through the doped regions.
申请公布号 DE19708766(A1) 申请公布日期 1998.02.05
申请号 DE1997108766 申请日期 1997.03.04
申请人 LG SEMICON CO., LTD., CHEONGJU, KR 发明人 CHOI, YONG-KYOO, CHEONGJU, KR
分类号 C25F3/14;G03F1/16;G03F1/20;H01L21/027;(IPC1-7):G03F1/08 主分类号 C25F3/14
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