| 摘要 |
<p>A probe positioning assembly for an armature tester has a plurality of electrical probes corresponding to the number of commutator bars in the armature to be tested. The probes are mounted on insulating blocks that are connected by spring arms to an insulating ring. In their neutral positions, the probes define a circular opening into which the armature can enter with clearance between the probes and the commutator. An actuator in contact with each support block also contacts at its other end a flexible membrane defining one wall of a hollow annular chamber surrounding the assembly. After the armature is in position with the commutator bars adjacent the probes, the hollow chamber is pressurized, causing the membrane to uniformly and simultaneously push on each actuator, so that each support block and the probes carried thereby move uniformly and simultaneously toward the commutator, until the probes touch the commutator bars. Testing can then be carried out, after which the hollow chamber is depressurized, allowing the support blocks and their probes to return to the neutral position under the influence of the spring arms. By providing a socket in the test station for receiving the assembly, one can provide a system that can test armatures of different sizes by inserting different sized assemblies in the socket. <IMAGE></p> |
