发明名称 METHOD OF MANUFACTURING CHIP-TYPE RESISTOR
摘要 <p>PROBLEM TO BE SOLVED: To enable a product conventionally discarded as a defective item to be finished by a method, wherein a resistance value is measured after the secondary baking step to be rebaked for correcting the resistance value for case the where the resistance value is out side the allowable range. SOLUTION: A finished product is manufactured through the first baking step, the second baking step and the outer layer-forming step. At this time, the resistance value is measured after the second baking step and if the measured value is out of the allowable range, the re-baking step added for correcting the resistance value prior to starting the outer layer-forming step. Next, the resistance value is plus + shifted by a required value and after confirming that the required resistance value is within the allowable range by the resistance value measurement, the resistor is fed to outer layer electrode- forming step, as the next step for finishing the resistor. At this time, if the resistance value is out of the allowable range at the measurement after the re-baking step, the baking meeting the baking requirements which meet the error value is to be further repeated.</p>
申请公布号 JPH1032109(A) 申请公布日期 1998.02.03
申请号 JP19960187926 申请日期 1996.07.17
申请人 ROHM CO LTD 发明人 TSUDA SHINJI
分类号 H01C17/22;H01C17/30;(IPC1-7):H01C17/22 主分类号 H01C17/22
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