发明名称 Test signal generator having timing calibration circuit
摘要 A timing signal generator generates timing signals having a timing resolution higher than a reference clock signal and can measure a delay time in the timing signal generator with high accuracy by a loop oscillation method. The timing signal generator includes: a phase lock loop having a variable delay circuit which is formed of a plurality of delay elements connected in series wherein a delay time in the variable delay circuit is phase locked with a clock signal, a track hold circuit provided in the phase lock loop to transfer a phase lock control voltage to the phase lock loop in a phase lock mode and to temporarily hold the control voltage in a loop oscillation mode, a selector circuit to select a timing signal from a plurality of signals corresponding to the plurality of delay elements to produce the timing signal at a timing output, an input selector for selectively providing the clock signal to the phase lock loop during the phase lock mode and a returning pulse from the timing output during the loop oscillation mode, and a pulse injection circuit for starting an oscillation in the closed loop by injecting a pulse signal in the closed loop.
申请公布号 US5712582(A) 申请公布日期 1998.01.27
申请号 US19960667399 申请日期 1996.06.21
申请人 ADVANTEST CORPORATION 发明人 YOKOTA, SHINICHI;OKAYASU, TOSHIYUKI
分类号 G01R31/3183;G01R31/319;G04F10/06;H03K5/13;H03K5/135;H03L7/00;H03L7/06;H03L7/08;H03L7/081;H03L7/14;(IPC1-7):H03L7/08 主分类号 G01R31/3183
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