SEMICONDUCTOR DEVICE AND FABRICATION THEREOF

摘要

PROBLEM TO BE SOLVED: To obtain a good quality of display without flickering by suppressing influences of a high-resistance region caused by an error in its dimensions when an error in the aligning accuracy is essentially present. SOLUTION: In the semiconductor device, high-resistance regions 102 and 103 are provided so as to dispose channel; region 107 there between, and high- resistance regions 108 and 109 are formed so as to dispose a channel region 109 therebetween. In this case, it is assumed that dimensions of the high- resistance regions 102 and 103 are different from those of the high-resistance regions 108 and 110 due to a aligning error during their fabrication. When the number of such channel regions are set to be even, symmetry in the operation of the thin-film transistor can be secured even when the aligning error is produced. Influences of information written in a pixel electrode 114 by a disturbance in the above symmetry can be avoided.