| 摘要 |
An appliance for measuring polarization mode dispersion (PMD) of a waveguide (2) comprises a source (1, 6) of wide-band polarized light, an interferometer (5) capable of receiving a light beam (21) sent by the source (1, 6), a detector (3) capable of detecting the light beam (25) from the interferometer (5), and an electronic processing unit (4) connected to the detector (3), capable of extracting a value tau representative of the polarization mode dispersion of the waveguide (2). The interferometer (5) divides a measuring light beam (22) sent by the source (1) into two interference light beams (23, 24). The measuring appliance comprises at least one birefringent element (17) positioned on the interferometer (5), capable of producing an algebraic difference of relative phase shifts in each of the two interference light beams (23, 24) equal to pi .
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