发明名称 Method of manufacturing a bipolar transistor
摘要 In a semiconductor apparatus having a PNP bipolar transistor and high voltage resistance, there is formed an oxide insulating layer in the surface region of a P-type semiconductor substrate. In the above semiconductor substrate is formed a P-type collector layer so that at least a part of the P-type collector layer is in contact with said oxide insulating layer. In the surface region of said P-type collector layer is formed a P-type collector contact layer. An N-type base layer is formed in that region on the surface side of said P-type collector layer in which said P-type collector contact layer does not exist. A P-type emitter layer is formed on the surface side of said N-type base layer. A P-type collector-contact/base leakage prevention layer, which has a higher impurity concentration than said P-type collector layer, is formed at least in that region of said P-type collector layer which is in contact with said oxide insulating layer, so as to prevent the generation of a leakage current between said P-type collector contact layer and said N-type base layer.
申请公布号 US5712174(A) 申请公布日期 1998.01.27
申请号 US19960618115 申请日期 1996.03.19
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 HIRAI, TAKEHIRO;TANAKA, MITSUO;HORI, ATSUSHI;SHIMOMURA, HIROSHI;HORIKAWA, YOSHIHIKO
分类号 H01L21/331;H01L21/70;H01L21/76;H01L21/822;H01L21/8222;H01L21/8249;H01L27/06;(IPC1-7):H01L21/265 主分类号 H01L21/331
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