发明名称 |
Vertical trench gate MOS device and a method of fabricating the same |
摘要 |
A low-voltage high-current discrete insulated-gate field-effect transistor which is made by a very economical process with two silicon etches. A buried poly gate gates conduction along a trench sidewall. The channel is provided by the residuum of an epi layer, and the source diffusion is provided by an unmasked implant which is screened only by various grown oxides. <IMAGE> |
申请公布号 |
EP0747967(A3) |
申请公布日期 |
1998.01.21 |
申请号 |
EP19960303213 |
申请日期 |
1996.05.08 |
申请人 |
SGS-THOMSON MICROELECTRONICS, INC. |
发明人 |
BLANCHARD, RICHARD A. |
分类号 |
H01L21/336;H01L29/10;H01L29/45;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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