发明名称 Vertical trench gate MOS device and a method of fabricating the same
摘要 A low-voltage high-current discrete insulated-gate field-effect transistor which is made by a very economical process with two silicon etches. A buried poly gate gates conduction along a trench sidewall. The channel is provided by the residuum of an epi layer, and the source diffusion is provided by an unmasked implant which is screened only by various grown oxides. <IMAGE>
申请公布号 EP0747967(A3) 申请公布日期 1998.01.21
申请号 EP19960303213 申请日期 1996.05.08
申请人 SGS-THOMSON MICROELECTRONICS, INC. 发明人 BLANCHARD, RICHARD A.
分类号 H01L21/336;H01L29/10;H01L29/45;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址